ESD Standards IEC 61340 ANSI S2020

Electrostatics - Part 5-1: Protection of electronic devices from electrostatic phenomena -  General requirements

IEC 61340-5-1:2016 is available as IEC 61340-5-1:2016 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.

IEC 61340-5-1:2016 applies to activities that: manufacture, process, assemble, install, package, label, service, test, inspect, transport or otherwise handle electrical or electronic parts, assemblies and equipment with withstand voltages greater than or equal to 100 V HBM, 200 V CDM and 35 V for isolated conductors. ESDS with lower withstand voltages may require additional control elements or adjusted limits. Processes designed to handle items that have lower ESD withstand voltage(s) can still claim compliance to this standard. This standard provides the requirements for an ESD control program. IEC TR 61340-5-2 [9] provides guidance on the implementation of this standard. This standard does not apply to electrically initiated explosive devices, flammable liquids, gases and powders. The purpose of this standard is to provide the administrative and technical requirements for establishing, implementing and maintaining an ESD control program (hereinafter referred to as the "program"). This edition includes the following significant technical changes with respect to the previous edition:
a) Technical requirements were changed to align IEC 61340-5-1 with other industry ESD standards;
b) Reference documents were updated to reflect newly released IEC standards;
c) A section on product qualification was added;
d) Table 4 was deleted and detailed packaging requirements were deferred to IEC 61340-5-3;
e) Clause A.1 was removed and is now included in IEC 61340-4-6.
The contents of the corrigendum of May 2017 have been included in this copy.

Electrostatics - Part 5-1: Protection of electronic devices from electrostatic phenomena -  General requirements

IEC 61340-5-1:2016 is available as IEC 61340-5-1:2016 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.

IEC 61340-5-1:2016 applies to activities that: manufacture, process, assemble, install, package, label, service, test, inspect, transport or otherwise handle electrical or electronic parts, assemblies and equipment with withstand voltages greater than or equal to 100 V HBM, 200 V CDM and 35 V for isolated conductors. ESDS with lower withstand voltages may require additional control elements or adjusted limits. Processes designed to handle items that have lower ESD withstand voltage(s) can still claim compliance to this standard. This standard provides the requirements for an ESD control program. IEC TR 61340-5-2 [9] provides guidance on the implementation of this standard. This standard does not apply to electrically initiated explosive devices, flammable liquids, gases and powders. The purpose of this standard is to provide the administrative and technical requirements for establishing, implementing and maintaining an ESD control program (hereinafter referred to as the "program"). This edition includes the following significant technical changes with respect to the previous edition:
a) Technical requirements were changed to align IEC 61340-5-1 with other industry ESD standards;
b) Reference documents were updated to reflect newly released IEC standards;
c) A section on product qualification was added;
d) Table 4 was deleted and detailed packaging requirements were deferred to IEC 61340-5-3;
e) Clause A.1 was removed and is now included in IEC 61340-4-6.
The contents of the corrigendum of May 2017 have been included in this copy.

Electrostatics - Part 5-2: Protection of electronic devices from electrostatic phenomena - User Guide

IEC TR 61340-5-2:2018 is available as IEC TR 61340-5-2:2018 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.

IEC TR 61340-5-2:2018, which has been developed to support IEC 61340-5-1, applies to activities that: manufacture, process, assemble, install, package, label, service, test, inspect, transport or otherwise handle electrical or electronic parts, assemblies and equipment with withstand voltages greater than or equal to 100 V HBM, 200 V CDM and 35 V for isolated conductors. Additional control elements or adjusted limits can be applicable for ESDS with lower withstand voltages. This second edition of IEC TR 61340-5-2 has been modified to provide guidance for users of IEC 61340-5-1:2016. The text has been arranged to follow the requirements of IEC 61340‑5‑1:2016 as closely as possible as well as providing specific guidance on each of the requirements of IEC 61340-5-1:2016.

Electrostatics - Part 5-2: Protection of electronic devices from electrostatic phenomena - User Guide

IEC TR 61340-5-2:2018 is available as IEC TR 61340-5-2:2018 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.

IEC TR 61340-5-2:2018, which has been developed to support IEC 61340-5-1, applies to activities that: manufacture, process, assemble, install, package, label, service, test, inspect, transport or otherwise handle electrical or electronic parts, assemblies and equipment with withstand voltages greater than or equal to 100 V HBM, 200 V CDM and 35 V for isolated conductors. Additional control elements or adjusted limits can be applicable for ESDS with lower withstand voltages. This second edition of IEC TR 61340-5-2 has been modified to provide guidance for users of IEC 61340-5-1:2016. The text has been arranged to follow the requirements of IEC 61340‑5‑1:2016 as closely as possible as well as providing specific guidance on each of the requirements of IEC 61340-5-1:2016.

Electrostatics - Part 5-3: Protection of electronic devices from electrostatic phenomena - Properties and requirements classifications for packaging intended for electrostatic discharge sensitive devices.

IEC 61340-5-3:2015 defines the ESD protective packaging properties needed to protect electrostatic discharge sensitive devices (ESDS) through all phases of production, rework/maintenance, transport and storage. Test methods are referenced to evaluate packaging and packaging materials for these product and material properties. Performance limits are provided. This standard does not address protection from electromagnetic interference (EMI), electromagnetic pulsing (EMP) or protection of volatile materials. This edition includes the following significant technical changes with respect to the previous edition:
a) removal of all references to ANSI/ESD STM11.13, replaced by normative reference IEC 61340-4-10;
b) additional notes added to Table 1;
c) addition of a new Table 3 related to the "ESD classification symbol" and the "primary function code

Electrostatics - Part 6-1: Electrostatic control for healthcare - General requirements for facilities

IEC 61340-6-1:2018 applies to facilities that provide healthcare including hospitals, care centres and clinics. This document provides technical requirements and recommendations for controlling electrostatic phenomena in healthcare facilities, which includes requirements for equipment, materials, and products used to control static electricity. The requirements of this document do not apply to medical electrical equipment specified in IEC 60601-1 and in vitro diagnostic (IVD) medical equipment specified in IEC 61010‑2‑101.

Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)

IEC 60749-26:2018 establishes the procedure for testing, evaluating, and classifying components and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined human body model (HBM) electrostatic discharge (ESD).
The purpose of this document is to establish a test method that will replicate HBM failures and provide reliable, repeatable HBM ESD test results from tester to tester, regardless of component type. Repeatable data will allow accurate classifications and comparisons of HBM ESD sensitivity levels.
ESD testing of semiconductor devices is selected from this test method, the machine model (MM) test method (see IEC 60749-27) or other ESD test methods in the IEC 60749 series. Unless otherwise specified, this test method is the one selected.
This fourth edition cancels and replaces the third edition published in 2013. This edition constitutes a technical revision. This standard is based upon ANSI/ESDA/JEDEC JS-001-2014. It is used with permission of the copyright holders, ESD Association and JEDEC Solid state Technology Association.
This edition includes the following significant technical changes with respect to the previous edition:
a)   a new subclause relating to HBM stressing with a low parasitic simulator is added, together with a test to determine if an HBM simulator is a low parasitic simulator;
b)   a new subclause is added for cloned non-supply pins and a new annex is added for testing cloned non-supply pins.

Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level

IEC 60749-28:2017(E) establishes the procedure for testing, evaluating, and classifying devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined field-induced charged device model (CDM) electrostatic discharge (ESD). All packaged semiconductor devices, thin film circuits, surface acoustic wave (SAW) devices, opto-electronic devices, hybrid integrated circuits (HICs), and multi-chip modules (MCMs) containing any of these devices are to be evaluated according to this document. To perform the tests, the devices are assembled into a package similar to that expected in the final application. This CDM document does not apply to socketed discharge model testers. This document describes the field-induced (FI) method. An alternative, the direct contact (DC) method, is described in Annex I.
The purpose of this document is to establish a test method that will replicate CDM failures and provide reliable, repeatable CDM ESD test results from tester to tester, regardless of device type. Repeatable data will allow accurate classifications and comparisons of CDM ESD sensitivity levels.

Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification

IEC 60862-1:2015 specifies the methods of test and general requirements for SAW filters of assessed quality using either capability approval or qualification approval procedures.
This edition includes the following significant technical changes with respect to the previous edition:
- the terms and definitions from IEC 60862-2:2002 are included;
- the measurement method for the balanced type filter is described;
- the electrostatic discharge (ESD) sensitivity test procedure is considered.

Electromagnetic compatibility (EMC) - Part 4-2: Testing and measurement techniques - Electrostatic discharge immunity test

IEC 61000-4-2:2008 relates to the immunity requirements and test methods for electrical and electronic equipment subjected to static electricity discharges, from operators directly, and from personnel to adjacent objects. It additionally defines ranges of test levels which relate to different environmental and installation conditions and establishes test procedures. The object of IEC 61000-4-2:2008 is to establish a common and reproducible basis for evaluating the performance of electrical and electronic equipment when subjected to electrostatic discharges. In addition, it includes electrostatic discharges which may occur frompersonnel to objects near vital equipment. IEC 61000-4-2:2008 defines typical waveform of the discharge current, range of test levels, test equipment, test setup, test procedure, calibration procedure and measurement uncertainty. IEC 61000-4-2:2008 gives specifications for test performed in "laboratories" and "post-installation tests" performed on equipment in the final installation. This second edition cancels and replaces the first edition published in 1995, its amendment 1 (1998) and its amendment 2 (2000) and constitutes a technical revision. It has the status of a basic EMC publication in accordance with IEC Guide 107. The main changes with respect to the first edition of this standard and its amendments are the following:
- the specifications of the target have been extended up to 4 GHz. An example of target matching these requirements is also provided;
- information on radiated fields from human-metal discharge and from ESD generators is provided;
- measurement uncertainty considerations with examples of uncertainty budgets are given too.

Varistors for use in electronic equipment - Part 1: Generic specification

IEC 61051-1:2018 RLV contains both the official IEC International Standard and its Redline version. The Redline version is available in English only and provides you with a quick and easy way to compare all the changes between the official IEC Standard and its previous edition.

IEC 61051-1:2018 is a generic specification and is applicable to varistors with symmetrical voltage-current characteristics for use in electronic equipment. It establishes standard terms, inspection procedures and methods of test for use in sectional and detail specifications for quality assessment or any other purpose. This edition includes the following significant technical changes with respect to the previous edition:

a) 10 new terms and definitions – leaded varistors, surface mount varistors(SMV), electrostatic discharge (ESD), ESD clamping voltage, equivalent rectangular pulse duration, maximum peak current derating characteristic, rated average dissipation power, rated energy, abnormal overvoltage withstanding duration and temperature derating curve – have been added (see 3.6, 3.7, 3.14, 3.15, 3.19, 3.20, 3.23, 3.24, 3.25 and 3.29);

b) General requirements for electrical tests and 7 new test items – clamping voltage, ESD clamping voltage, maximum peak current, rated average dissipation power, rated energy, electrostatic discharge (ESD), robustness of terminations of surface mount varistors – have been added (see 6.5, 6.11, 6.12, 6.13, 6.14, 6.15, 6.16 and 6.17.8);
c) In 6.6, 6.7, 6.8, 6.9.3, 6.23.2, 6.23.4 and 6.26, following test items have been revised:
- Varistor voltage, leakage current and capacitance: more detailed requirements and information have been added;
- Voltage proof – foil method: the space between the edge of the foil and each termination has been changed from 1 mm ~ 1,5 mm to 3 mm ~ 3.5 mm for testing varistors not having axial terminations and the minimum space between the foil and the termination has been changed from 1 mm to 3 mm for testing varistors having axial terminations;
- Climatic sequence – dry heat: the method has been changed from Ba to Bb;
- Climatic sequence – cold: the method has been changed from Aa to Ab;
- Endurance at upper category temperature: the method of “applying test voltages in cycles of 1,5 h on and 0,5 h off”
has been changed to the method of applying test voltages continuously throughout the test lasting for 1 000 h;
d) The test items of pulse current, voltage under pulse condition and bump have been deleted from the section of test and measurement procedures;
e) Annex A and the contents referring to the test fixture specified in Annex A have been deleted;
f) All contents related to silicon carbide varistors have been deleted;
g) A new normative annex entitled “Test pulses used in this specification” (Annex B) has been added;
h) A new informative annex entitled "Recommended measurement/test methods for characteristics and parameters for application reference" (Annex C) has been added, in which guidelines of measuring/testing characteristics and parameters for application reference including voltage vs. current characteristic, maximum peak current derating characteristic, thermal resistance and abnormal overvoltage withstanding duration have been given.

Electrostatics Part 2-1: Measurements methods - ability of materials and products to dissipate static electric charge

IEC 61340-2-1:2015 describes test methods for measuring the rate of dissipation of static charge of insulating and static dissipative materials and products. It includes a generic description of test methods and detailed test procedures for specific applications. The two test methods for measuring charge decay time, one using corona charging and one using a charged metal plate are different and may not give equivalent results. Nevertheless, each method has a range of applications for which it is best suited. The corona charging method is suitable for evaluating the ability of materials, e.g. textiles, packaging, etc., to dissipate charge from their own surfaces. The charged metal plate method is suitable for evaluating the ability of materials and objects such as gloves, finger cots, hand tools, etc. to dissipate charge from conductive objects placed on or in contact with them. The charged plate method may not be suitable for evaluating the ability of materials to dissipate charge from their own surfaces. In addition to its general application, this horizontal standard is also intended for use by technical committees in the preparation of standards in accordance with the principles laid down in IEC Guide 108. This edition includes the following significant technical changes with respect to the previous edition:
a) the first edition supported requirements in IEC TR 61340-5-1, but with the revision of IEC TR 61340-5-1 into an International Standard, this support is no longer required; references to IEC 61340-5-1 have been removed;
b) the introduction gives additional information on when charge decay time measurements are appropriate, and the applications for which each of the two test methods are best suited;
c) procedures for performance verification of measuring instruments for the corona charging method have been added. It has the status of a horizontal standard in accordance with IEC Guide 108.

Electrostatics Part 2-3: Methods of test for determining the resistance and resistivity of solid planar materials used to avoid electrostatic charge accumulation

IEC 61340-2-3:2016 is available as IEC 61340-2-3:2016 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.

IEC 61340-2-3:2016 describes test methods for the determination of the electrical resistance and resistivity of solid materials used to avoid electrostatic charge accumulation, in which the measured resistance is in the range 10K Ohm to 1T Ohm. It takes account of existing IEC/ISO standards and other published information, and gives recommendations and guidelines on the appropriate method. This edition includes the following significant technical changes with respect to the previous edition:
a) a distinction has been introduced between instrumentation used for laboratory evaluations, instrumentation used for acceptance testing and instrumentation used for compliance verification (periodic testing);
b) an alternative electrode assembly is described, which can be used on non-planar products or when the dimensions of the product under test are too small to allow the larger electrode assembly to be used;
c) the formulae for calculating surface and volume resistivity have been modified to correspond with common industry practice in the main areas of application for the IEC 61340 series.

Electrostatics Part 2-3: Methods of test for determining the resistance and resistivity of solid planar materials used to avoid electrostatic charge accumulation

IEC 61340-2-3:2016 is available as IEC 61340-2-3:2016 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.

IEC 61340-2-3:2016 describes test methods for the determination of the electrical resistance and resistivity of solid materials used to avoid electrostatic charge accumulation, in which the measured resistance is in the range 10K Ohm to 1T Ohm. It takes account of existing IEC/ISO standards and other published information, and gives recommendations and guidelines on the appropriate method. This edition includes the following significant technical changes with respect to the previous edition:
a) a distinction has been introduced between instrumentation used for laboratory evaluations, instrumentation used for acceptance testing and instrumentation used for compliance verification (periodic testing);
b) an alternative electrode assembly is described, which can be used on non-planar products or when the dimensions of the product under test are too small to allow the larger electrode assembly to be used;
c) the formulae for calculating surface and volume resistivity have been modified to correspond with common industry practice in the main areas of application for the IEC 61340 series.

Electrostatics - Part 3-1: Methods for simulation of electrostatic effects - Human body model (HBM) electrostatic discharge test waveforms

Describes the discharge current waveforms used to simulate human body model (HBM) electrostatic discharges (ESD) and the basic requirements for equipment used to develop and verify these waveforms. This standard covers HBM ESD waveforms for use in general test methods and for application to materials or objects, electronic components and other items for ESD withstand-test or performance-evaluation purposes. The specific application of these HBM ESD waveforms to non-powered semiconductor devices is covered in IEC 60749-26. The waveforms defined in this standard are not intended for use in the testing of powered electronic systems for electromagnetic compatibility (EMC), which is covered in IEC 61000-4-2. The major change of this document is that it no longer contains the application to semiconductor devices

Electrostatics - Part 3-2: Methods for simulation of electrostatic effects - Machine model (MM) electrostatic discharge test waveforms

Describes the discharge current waveforms used to simulate human body model (HBM) electrostatic discharges (ESD) and the basic requirements for equipment used to develop and verify these waveforms. This standard covers HBM ESD waveforms for use in general test methods and for application to materials or objects, electronic components and other items for ESD withstand-test or performance-evaluation purposes. The specific application of these HBM ESD waveforms to non-powered semiconductor devices is covered in IEC 60749-26. The waveforms defined in this standard are not intended for use in the testing of powered electronic systems for electromagnetic compatibility (EMC), which is covered in IEC 61000-4-2. The major change of this document is that it no longer contains the application to semiconductor devices